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{{Short description|American engineer (born 1943)}}
{{Short description|American engineer (born 1943)}}
{{Infobox scientist
⚫
|name=Thomas W. Williams
|image=
|caption=
|birth_name=Thomas W. Williams
|birth_date={{Birth date|1943|8|3}}
|birth_place=U.S.
|death_date=
|death_place=
|nationality=
|occupation= Scientist and engineer
|known_for = [[design for testability]]
|education=[[Clarkson University]] ([[Bachelor of Engineering|BSE]])<br>[[State University of New York at Binghamton]] ([[Bachelor of Arts|BA.Ma]])<br>[[Colorado State University]] ([[Doctor of Philosophy|PhD.]])
|work_institutions=
|parents=
|spouse=
|relatives=
}}
'''Thomas W. Williams''' (born August 3, 1943) was an American engineer, Chief Scientist and fellow at [[Synopsys]]. He is known for his contributions to electronic design, automation and testing of electronic systems.


== Education and career ==
⚫
'''Thomas W. Williams''' (born August 3, 1943) was an American engineer and Chief Scientist at [[Synopsys]]. He was named a [[List of IEEE fellows|fellow]] of the [[Institute of Electrical and Electronics Engineers]] in 1988 “for leadership and contributions to the area of design for testability.”<ref name="ieee"/> In 1989 Williams shared with [[Edward B. Eichelberger]] the 1989 [[IEEE Computer Society]] [[W. Wallace McDowell Award]]<ref name ="mcdowell">{{cite web| url = https://www.computer.org/profiles/thomas-williams | title = Thomas Williams, Award Recipient | access-date = August 22, 2023 | publisher = IEEE Computer Society}}</ref> “for developing the [[level-sensitive scan design|level-sensitive scan technique]] of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.”
Williams obtained a bachelor's degree in [[electrical engineering]] from [[Clarkson University]], a master's degree in [[pure mathematics]] from the [[State University of New York at Binghamton]], and a Ph.D. in [[electrical engineering]] from [[Colorado State University]].<ref name="synopsys"/> He worked as a manager of the [[VLSI Design]] for Testability group at the [[IBM Microelectronics Division]] in [[Boulder, Colorado]]. He then joined [[Synopsys]] where he became a fellow and Chief Scientist.


Williams was the founder and chair of the [[IEEE Computer Society]] workshop on [[design for testability]], as well as the co-founder of the European workshop on design for testability. Williams chaired the IEEE technical subcommittee on design for testability and has been a keynote and invited speaker at international conferences.<ref name="mcdowell"/> Williams was honored as a Distinguished Visiting Speaker by the IEEE Computer Society from 1982 to 1985. He served as a special-issue editor for the [[IEEE Transactions on Computers]] and the [[IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems]].
⚫
In 2018, Williams was the recipient of the [[Phil Kaufman Award]] "for his outstanding contributions to [[test automation]] and his overall impact on the electronics industry".<ref name="ESDA-award" /><ref name="ESDA-PR" />


== Awards and accomplishments ==
⚫
Williams coauthored 50 publications and 20 patents. Among his best-paper awards are:<ref name ="mcdowell"/>
⚫
Williams was named a [[List of IEEE fellows|fellow]] of the [[Institute of Electrical and Electronics Engineers]] in 1988 “for leadership and contributions to the area of [[design for testability]].”<ref name="ieee"/> In 1989 Williams shared with [[Edward B. Eichelberger]] the 1989 [[IEEE Computer Society]] [[W. Wallace McDowell Award]]<ref name ="mcdowell">{{cite web| url = https://www.computer.org/profiles/thomas-williams | title = Thomas Williams, Award Recipient | access-date = August 22, 2023 | publisher = IEEE Computer Society}}</ref> “for developing the [[level-sensitive scan design | level-sensitive scan technique]] of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.”


In 2007, Williams received the European Design and Automation Association (EDAA) Lifetime Achievement Award<ref name = "synopsys">{{cite web| url = https://news.synopsys.com/index.php?s=20295&item=122606 | title =
⚫
* 1987 Outstanding Paper Award from the IEEE International Test Conference for his work in the area of VLSI Self-Testing, (with W. Daehn, M. Gruetzner, and C. W. Starke),
Synopsys Fellow Dr. Thomas W. Williams to Receive EDAA Lifetime Achievement Award | publisher = Synopsys | date = April 2007}}
⚫
* 1987 Outstanding Paper Award from the CompEuro’87 for his work on Self-Test,
</ref> for outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems.<ref>{{cite journal| url =
⚫
* 1989 Outstanding Paper Award (Honorable Mention) from the IEEE International Test Conference for his work on AC Test Quality (with U. Park and M. R. Mercer),
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4237503 |title = T.W. Williams Wins EDAA Lifetime Achievement Award | journal = IEEE Design & Test of Computers | pages = 200 | date = March–April 2007}}</ref> This award was presented during the opening session of the [[Design Automation and Test in Europe]] conference.
⚫
* 1991 Outstanding Paper Award from the ACM/IEEE [[Design Automation Conference]] for his work in the area of Synthesis and Testing (with B. Underwood and M. R. Mercer).


In 2010, Williams was the recipient of the IEEE Test Technology Technical Council Lifetime Contribution Medal.<ref>{{cite web| url = https://www.ieee-tttc.org/tttc-lifetime-contribution-medal/ | title = IEEE TTTC Lifetime Contribution Medal | website = ieee-tttc.org | access-date = August 23, 2023}}
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== External links ==
</ref><ref>{{cite journal | url = https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5713304 | title = Tom Williams Wins TTTC Award | first = Bob | last = Ward | journal = IEEE Computer | volume = 44 | issue = 2 | pages = 74-76 | date = February 2011}}
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* {{DBLP | pid = 11/4264 | name = Thomas W. Williams}}
</ref>

⚫
In 2018, the [[Electronic System Design Alliance]] honored Williams with the [[Phil Kaufman Award]] "for his outstanding contributions to [[test automation]] and his overall impact on the electronics industry".<ref name="ESDA-award" /><ref name="ESDA-PR" />

⚫
Williams coauthored four books, 50 refereed publications and 20 patents. He received the following Outstanding Paper Awards:<ref name ="mcdowell"/>

⚫
* in 1987 from the IEEE International Test Conference for work on [[VLSI]] self-testing (with W. Daehn, M. Gruetzner, and C. W. Starke),
⚫
* in 1987 from the CompEuro’87 for work on self-test,
⚫
* in 1989 from the IEEE International Test Conference for work on AC test quality (with U. Park and M. R. Mercer),
⚫
* in 1991 from the ACM/IEEE [[Design Automation Conference]] for work on synthesis and testing (with B. Underwood and M. R. Mercer).


== References ==
== References ==
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</references>
</references>

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== External links ==
* {{DBLP | pid = 11/4264 | name = Thomas W. Williams}}


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{{DEFAULTSORT:Williams, Thomas}}
[[Category:Fellow Members of the IEEE]]
[[Category:Fellows of the IEEE]]
[[Category:American electrical engineers]]
[[Category:American electrical engineers]]
[[Category:American computer scientists]]
[[Category:Electronic design automation people]]
[[Category:Electronic design automation people]]
[[Category:Award winners]]
[[Category:Technical writers]]
[[Category:American inventors]]
[[Category:1943 births]]
[[Category:1943 births]]
[[Category:Place of birth missing]]
[[Category:Place of birth missing]]

{{US-electrical-engineer-stub}}

{{improve categories|date=August 2023}}

Latest revision as of 00:21, 2 May 2024

Thomas W. Williams
Born
Thomas W. Williams

(1943-08-03)August 3, 1943
U.S.
EducationClarkson University (BSE)
State University of New York at Binghamton (BA.Ma)
Colorado State University (PhD.)
Occupation(s)Scientist and engineer
Known fordesign for testability

Thomas W. Williams (born August 3, 1943) was an American engineer, Chief Scientist and fellow at Synopsys. He is known for his contributions to electronic design, automation and testing of electronic systems.

Education and career

[edit]

Williams obtained a bachelor's degree in electrical engineering from Clarkson University, a master's degree in pure mathematics from the State University of New York at Binghamton, and a Ph.D. in electrical engineering from Colorado State University.[1] He worked as a manager of the VLSI Design for Testability group at the IBM Microelectronics Division in Boulder, Colorado. He then joined Synopsys where he became a fellow and Chief Scientist.

Williams was the founder and chair of the IEEE Computer Society workshop on design for testability, as well as the co-founder of the European workshop on design for testability. Williams chaired the IEEE technical subcommittee on design for testability and has been a keynote and invited speaker at international conferences.[2] Williams was honored as a Distinguished Visiting Speaker by the IEEE Computer Society from 1982 to 1985. He served as a special-issue editor for the IEEE Transactions on Computers and the IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

Awards and accomplishments

[edit]

Williams was named a fellow of the Institute of Electrical and Electronics Engineers in 1988 “for leadership and contributions to the area of design for testability.”[3] In 1989 Williams shared with Edward B. Eichelberger the 1989 IEEE Computer Society W. Wallace McDowell Award[2] “for developing the level-sensitive scan technique of testing solid-state logic circuits and for leading, defining, and promoting design for testability concepts.”

In 2007, Williams received the European Design and Automation Association (EDAA) Lifetime Achievement Award[1] for outstanding contributions to the state of the art in electronic design, automation and testing of electronic systems.[4] This award was presented during the opening session of the Design Automation and Test in Europe conference.

In 2010, Williams was the recipient of the IEEE Test Technology Technical Council Lifetime Contribution Medal.[5][6]

In 2018, the Electronic System Design Alliance honored Williams with the Phil Kaufman Award "for his outstanding contributions to test automation and his overall impact on the electronics industry".[7][8]

Williams coauthored four books, 50 refereed publications and 20 patents. He received the following Outstanding Paper Awards:[2]

  • in 1987 from the IEEE International Test Conference for work on VLSI self-testing (with W. Daehn, M. Gruetzner, and C. W. Starke),
  • in 1987 from the CompEuro’87 for work on self-test,
  • in 1989 from the IEEE International Test Conference for work on AC test quality (with U. Park and M. R. Mercer),
  • in 1991 from the ACM/IEEE Design Automation Conference for work on synthesis and testing (with B. Underwood and M. R. Mercer).

References

[edit]
  1. ^ a b "Synopsys Fellow Dr. Thomas W. Williams to Receive EDAA Lifetime Achievement Award". Synopsys. April 2007.
  2. ^ a b c "Thomas Williams, Award Recipient". IEEE Computer Society. Retrieved August 22, 2023.
  3. ^ "Fellows directory". IEEE. Retrieved July 30, 2023.
  4. ^ "T.W. Williams Wins EDAA Lifetime Achievement Award". IEEE Design & Test of Computers: 200. March–April 2007.
  5. ^ "IEEE TTTC Lifetime Contribution Medal". ieee-tttc.org. Retrieved August 23, 2023.
  6. ^ Ward, Bob (February 2011). "Tom Williams Wins TTTC Award". IEEE Computer. 44 (2): 74–76.
  7. ^ "2018 ESD Alliance / CEDA Phil Kaufman Award". Electronic System Design Alliance. Retrieved 6 August 2023.
  8. ^ "Dr. Thomas W. Williams Honored with 2018 Phil Kaufman Award" (PDF). Electronic System Design Alliance. August 28, 2018. Retrieved 6 August 2023.
[edit]
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